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Publications

Export 17 results:
Author Title [ Type(Desc)] Year
Filters: Author is Kruskopf, Mattias  [Clear All Filters]
Conference Paper
Epitaxial Graphene for High-Current QHE Resistance Standards, M. Kruskopf, J. Hu, B-Y. Wu, Y. Yang, H-Y. Lee, A. F. Rigosi, D. B. Newell, and R. E. Elmquist , 2018 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2018) (2018)
Epitaxial Graphene p-n Junctions, J. Hu, M. Kruskopf, Y. Yang, B-Y. Wu, J. Tian, A. Panna, A. F. Rigosi, H-Y. Lee, S. Payagala, G. R. Jones, et al. , 2018 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2018) (2018)
A Table-Top Graphene Quantized Hall Standard, A. F. Rigosi, A. R. Panna, S. U. Payagala, G. R. Jones, M. E. Kraft, M. Kruskopf, B-Y. Wu, H-Y. Lee, Y. Yang, D. G. Jarrett, et al. , 2018 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2018) (2018)
Uncertainty of the Ohm Using Cryogenic and Non-Cryogenic Bridges, A. R. Panna, M. E. Kraft, A. F. Rigosi, G. R. Jones, S. U. Payagala, M. Kruskopf, D. G. Jarrett, and R. E. Elmquist , 2018 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2018) (2018)
Journal Article
Accessing ratios of quantized resistances in graphene p-n junction devices using multiple terminals, D. Patel, M. Marzano, , H. M. Hill, M. Kruskopf, H. Jin, J. Hu, D. B. Newell, C-T. Liang, R. Elmquist, et al. , AIP Adv., 10, 025112 (2020)
Analysing quantized resistance behaviour in graphene Corbino p-n junction devices, , D. S. Scaletta, D. K. Patel, M. Kruskopf, A. Levy, H. M. Hill, and A. F. Rigosi , J. Phys. D-Appl. Phys., 53, 275301 (2020)
Analytical determination of atypical quantized resistances in graphene p-n junctions, A. F. Rigosi, M. Marzano, A. Levy, H. M. Hill, D. K. Patel, M. Kruskopf, H. Jin, R. E. Elmquist, and D. B. Newell , Physica B, 582, 411971 (2020)
Atypical quantized resistances in millimeter-scale epitaxial graphene p-n junctions, A. E. Rigosi, D. Patel, M. Marzano, M. Kruskopf, H. M. Hill, H. Jin, J. Hu, A. R. Hight Walker, M. Ortolano, L. Callegaro, et al. , Carbon, 154, 230-237 (2019)
Confocal laser scanning microscopy for rapid optical characterization of graphene, V. Panchal, Y. Yang, G. Cheng, J. Hu, M. Kruskopf, , A. F. Rigosi, C. Melios, A. R. Hight Walker, D. B. Newell, et al. , COMMUNICATIONS PHYSICS, 1, 83 (2018)
Epitaxial graphene for quantum resistance metrology, M. Kruskopf, and R. E. Elmquist , METROLOGIA, 55, R27-R36 (2018)
Examining epitaxial graphene surface conductivity and quantum Hall device stability with Parylene passivation, A. F. Rigosi, C-I. Liu, B. Yi Wu, H-Y. Lee, M. Kruskopf, Y. Yang, H. M. Hill, J. Hu, E. G. Bittle, J. Obrzut, et al. , MICROELECTRONIC ENGINEERING, 194, 51-55 (2018)
Gateless and reversible Carrier density tunability in epitaxial graphene devices functionalized with chromium tricarbonyl, A. F. Rigosi, M. Kruskopf, H. M. Hill, H. Jin, B-Y. Wu, P. E. Johnson, S. Zhang, M. Berilla, A. R. Hight Walker, C. A. Hacker, et al. , Carbon, 142, 468-474 (2019)
Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards, A. F. Rigosi, A. R. Panna, S. U. Payagala, M. Kruskopf, M. E. Kraft, G. R. Jones, B-Y. Wu, H-Y. Lee, Y. Yang, J. Hu, et al. , IEEE Trans. Instrum. Meas., 68, 1870-1878 (2019)
Next-generation crossover-free quantum Hall arrays with superconducting interconnections, M. Kruskopf, A. F. Rigosi, A. R. Panna, M. Marzano, D. Patel, H. Jin, D. B. Newell, and R. E. Elmquist , Metrologia, 56, 065002 (2019)
Quantum Hall device data monitoring following encapsulating polymer deposition, A. F. Rigosi, C-I. Liu, B. Yi Wu, H-Y. Lee, M. Kruskopf, Y. Yang, H. M. Hill, J. Hu, E. G. Bittle, J. Obrzut, et al. , DATA IN BRIEF, 20, 1201-1208 (2018)
Towards epitaxial graphene p-n junctions as electrically programmable quantum resistance standards, J. Hu, A. F. Rigosi, M. Kruskopf, Y. Yang, B-Y. Wu, J. Tian, A. R. Panna, H-Y. Lee, S. U. Payagala, G. R. Jones, et al. , SCIENTIFIC REPORTS, 8, 15018 (2018)
Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry, M. Kruskopf, A. F. Rigosi, A. R. Panna, D. K. Patel, H. Jin, M. Marzano, M. Berilla, D. B. Newell, and R. E. Elmquist , IEEE Trans. Electron Devices, 66, 3973-3977 (2019)