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The XYZ of imaging cold atomic samples

August 9, 2019 - 3:30pm
Francisco Salces Carcoba

Abstract: I shall give a brief overview of the technical aspects involved in imaging cold atomic samples. First, I quickly refresh the transverse (XY) aspects of imaging, including aberrations and resolution, all within the usual Fourier optics framework. Then, I dwell in the problem of recorded intensity (Z), by listing common sources of technical noise present in most sensors. Finally, I review popular imaging methods while highlighting their advantages and limitations, from fluorescence through bright and dark field, resonant absorption, dispersive phase contrast, faraday rotation, and holographic imaging.

For students and postdocs only - though anyone may join for beverages after 4:30 pm
PSC 2136
College Park, MD 20742